TruView™ 6010 B

X-Ray Inspection Equipment

Engineered for the detection of foreign matter contaminants in bulk materials and other large-volume products. The system provides reliable, high-sensitivity inspection to safeguard product purity, ensure consumer safety, and support regulatory compliance across diverse industries.

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Footprint

1200(W)X2799(D)X2100(H)mm

Machine Weight

950 kg

Power Supply

AC 110/220V, 50/60Hz

Tube Type

Sealed

X-ray Source

210/350W、80-120kV

Detector

0.4mm high resolution detector

Channel size

600mm(W)*100mm(H)

Conveyor Speed

10-120M/min

Max. Loading weight

10kg

 

Detection Accuracy

SUS BALL≥ø0.3mm

SUS wire≥ø0.2*2mm

Glass ball≥ø1.0mm

Ceramic ball≥ø1.0mm

  • Easy to operate: one button start&stop, optional default product.

  • Provide high precision automatic foreign detection, it can effectively identify metal, ceramic, glass, bone, shell and other malignant foreign matter in the product.

  • Sensitivity adjustment, alarm management, powerful data statistics report.

  • The detection sensitivity reaches the industry’s highest standard intelligent algorithm based on in-depth learning of AI

Equipment Features
  • Footprint: 1200(W)X2799(D)X2100(H)mm
  • Machine Weight: 950 kg
  • Power Supply: AC 110/220V, 50/60Hz
  • Tube Type: Sealed
  • X-ray Source: 210/350W、80-120kV
  • Detector: 0.4mm high resolution detector
  • Channel size: 600mm(W)*100mm(H)
  • Conveyor Speed: 10-120M/min
  • Max. Loading weight: 10kg
Capability
  • Detection Accuracy
    • SUS BALL≥ø0.3mm
      SUS wire≥ø0.2*2mm
      Glass ball≥ø1.0mm
      Ceramic ball≥ø1.0mm
Additional Functions
  • Easy to operate: one button start&stop, optional default product;Provide high precision automatic foreign detection, it can effectively identify metal, ceramic, glass, bone, shell and other malignant foreign matter in the product.
  • Sensitivity adjustment, alarm management, powerful data statistics report.
  • The detection sensitivity reaches the industry’s highest standard intelligent algorithm based on in-depth learning of AI.